Nanoparticle Tracking Using Atomic Force Microscopy

{
  "id": "10.6678/80905",
  "pubType": "Document",
  "published": true,
  "title": "Nanoparticle Tracking Using Atomic Force Microscopy",
  "content": "This document examines the use of atomic force microscopy (AFM) for tracking nanoparticles within various environments. AFM provides a powerful tool for the study of particle dynamics at the nanoscale, enhancing our understanding of colloidal stability and nanoparticle interactions with biological systems."
}